AI plays a role in improving defect capture rate and distinguishing between yield-killing and nuisance defects. New developments in wafer edge inspection are proving essential to bonded wafer yields.

Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.

Additive manufacturing (AM) encompasses a suite of layer-by-layer fabrication techniques that enable the rapid production of complex geometries from digital models. Central to the industrial adoption ...